flash: fix typos and duplicated words
Fix typos and duplicated words in comments and strings. Change-Id: I64282c7018462deefeeb8e5f4d0d81942425b3fc Signed-off-by: Antonio Borneo <borneo.antonio@gmail.com> Reviewed-on: http://openocd.zylin.com/5758 Tested-by: jenkins Reviewed-by: Tomas Vanek <vanekt@fbl.cz> Reviewed-by: Christopher Head <chead@zaber.com>
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@@ -49,8 +49,8 @@
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#define FTCTR 0x2020000C /* Flash test control */
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#define FBWST 0x20200010 /* Flash bridge wait-state */
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#define FCRA 0x2020001C /* Flash clock divider */
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#define FMSSTART 0x20200020 /* Flash Built-In Selft Test start address */
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#define FMSSTOP 0x20200024 /* Flash Built-In Selft Test stop address */
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#define FMSSTART 0x20200020 /* Flash Built-In Self Test start address */
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#define FMSSTOP 0x20200024 /* Flash Built-In Self Test stop address */
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#define FMS16 0x20200028 /* Flash 16-bit signature */
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#define FMSW0 0x2020002C /* Flash 128-bit signature Word 0 */
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#define FMSW1 0x20200030 /* Flash 128-bit signature Word 1 */
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@@ -160,7 +160,7 @@ struct lpc2900_flash_bank {
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/**
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* Maximum contiguous block of internal SRAM (bytes).
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* Autodetected by the driver. Not the total amount of SRAM, only the
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* Autodetected by the driver. Not the total amount of SRAM, only
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* the largest \em contiguous block!
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*/
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uint32_t max_ram_block;
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@@ -1535,7 +1535,7 @@ static int lpc2900_erase_check(struct flash_bank *bank)
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return status;
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}
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/* Use the BIST (Built-In Selft Test) to generate a signature of each flash
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/* Use the BIST (Built-In Self Test) to generate a signature of each flash
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* sector. Compare against the expected signature of an empty sector.
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*/
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for (unsigned int sector = 0; sector < bank->num_sectors; sector++) {
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